As photonics technology becomes increasingly sophisticated, optical measurements grow increasingly complex. To make reliable measurements, one must consider the characteristics and interactions of ...

Optical non-contact profilers are interference microscopes used to accurately measure the three-dimensional height variations on surfaces of a given test material. Optical profilers manipulate the ...

Patterning challenges for the semiconductor industry are growing as the number of multi-patterned layers being used in the 10nm and beyond nodes increase. Patterning requires highly accurate overlay ...

With the continuous advancement of photoelectric performance in major equipment and advanced instruments, traditional optical elements are increasingly inadequate to meet the demands of modern systems ...

Measuring super smooth surfaces generally necessitates the use of optical metrology tools, but it is important to note that optical solutions are not all the same. The choice of metrology solution for ...

Primary performance data for passive fiber-optic devices is provided by spectral measurement of optical insertion loss (IL) and polarization-dependent loss (PDL). Often used to characterize optical ...

A European collaboration involving clock experts from the National Physical Laboratory (NPL), the Physikalisch-Technische Bundesanstalt (PTB) and the Istituto Nazionale di Ricerca Metrologica (INRIM) ...

Scientists have demonstrated the fastest distance measurement so far. The researchers demonstrated on-the-fly sampling of a gun bullet profile with micrometer accuracy. The experiment relied on a ...

The Korea Research Institute of Standards and Science has successfully developed a length measurement system that achieves a level of precision approaching the theoretical limit allowed by quantum ...

No audio available for this content. Photo: Topcon Positioning Group Topcon Positioning Group announces a new technology — Hybrid Positioning — that increases efficiencies and improves productivity on ...